17–21 Feb 2025
Vienna University of Technology
Europe/Vienna timezone

Radiation-resistant silicon sensors with internal gain for the ATLAS High-Granularity Timing Detector at the High-Luminosity LHC

18 Feb 2025, 11:35
20m
EI7

EI7

Talk Semiconductor Detectors Plenary Timing

Speaker

Xiao Yang (CERN)

Description

The increase of the particle flux (pile-up) at the high-luminosity phase of the Large Hadron Collider (HL-LHC) with an instantaneous luminosity up to $\mathcal{L} \approx 7.5\times10^{34}$ cm$^{-2}$s$^{-1}$ will have a severe impact on the ATLAS detector reconstruction and trigger performance. The High-Granularity Timing Detector (HGTD) will be installed in the forward region for pile-up mitigation and luminosity measurements. Two double-sided layers, based on Low-Gain Avalanche Detectors (LGADs) and custom ASICs, will provide a time resolution of better than 50 ps per track throughout the HL-LHC period. The chosen radiation-hardened LGAD technology provides suitable gain to reach the required signal-to-noise ratio, and a granularity of 1.3 × 1.3 mm$^2$. At total of 3.7M channels will cover more than 6 m$^2$ of silicon. As part of the Quality Control (QC) during the sensor production, a comprehensive measurement programme is pursued, consisting of electrical and functional tests on sensors and dedicated test structures (QC-TS) before and after radiation exposure. This contribution introduces the requirements and the technical design of the overall detector system and describes the design of the LGAD sensors and the QC-TS, as well as the QC strategy during the sensor production. Electrical measurements and test-beam performance results for the recently concluded pre-series production of LGAD sensors and QC-TS are presented.

Primary experiment ATLAS

Author

Presentation materials