Feb 17 – 21, 2025
Vienna University of Technology
Europe/Vienna timezone

High-precision alpha spectroscopy using solid-state detectors

Feb 18, 2025, 3:40 PM
50m
Vienna University of Technology

Vienna University of Technology

Gusshausstraße 27-29, 1040 Wien
Board: 83
Poster Semiconductor Detectors Coffee & Posters A

Speaker

Divya Divya (Vienna University of Technology (AT))

Description

Single-crystal chemical vapour deposition (sCVD) diamond detectors are known for their high radiation hardness and excellent performance at elevated temperatures. Recent results have shown that silicon carbide (SiC) sensors are promising candidates for particle spectroscopy in demanding environments. In this study, we present a comparative analysis of the achievable energy resolution of sCVD and SiC detectors compared to standard silicon (Si) detectors. To do so, alpha spectroscopy is performed, a reliable technique for calibrating newly developed detectors. The measurements were conducted in a vacuum environment of $10^{-3}$ mbar using an unsealed $^{241}\text{Am}$ alpha-particle source and CIVIDEC’s high-resolution data acquisition system, ROSY® AX106. The experimental results are compared to Geant4 simulations. Additionally, the impact of gold (Au) and titanium (Ti) electrodes on the achievable energy resolution is examined.

Author

Divya Divya (Vienna University of Technology (AT))

Co-authors

Christina Weiss (Vienna University of Technology (AT)) Dieter Hainz (Vienna University of Technology (AT)) Erich Griesmayer (Vienna University of Technology (AT)) Julian Melbinger (Vienna University of Technology (AT))

Presentation materials