17–21 Feb 2025
Vienna University of Technology
Europe/Vienna timezone

3D microbeam characterization of large-area silicon carbide detectors

19 Feb 2025, 10:40
50m
Vienna University of Technology

Vienna University of Technology

Gusshausstraße 27-29, 1040 Wien
Board: 80
Poster Semiconductor Detectors Coffee & Posters B

Speaker

Alessandro Spatafora (INFN-LNS & Università di Catania)

Description

Silicon carbide (SiC) detectors are a state-of-the-art technology for particle detection. The great interest relies in the high radiation hardness of SiC and good energy resolution. Large-area SiC detectors were chosen as the ∆E stage of new telescopes used in the particle identification system of the MAGNEX magnetic spectrometer in the context of the NUMEN project. The adopted SiC detectors are ≈2.2 cm2, with total thickness of 110 µm (100 µm epitaxy and 10 µm inert substrate) and edge structure ≈400 µm wide. IV and CV characteristics were measured to define the full depletion voltage and the doping profile. A characterization test of SiC was also performed by using a proton microbeam at the Ruđer Bošković Institute to study the charge collection efficiency. The beam spot was ≈2 µm and the scan steps were ≈10 µm. Three measurements were performed: i) the inner region and the edges were explored at different voltages and proton energies to obtain 3D characterization of the CCE profile; ii) the inert substrate thickness was estimated by irradiating the sensor on the back side at different incident angles. Indeed, the correlation between the residual energy and the proton incident angle allows to evaluate the thickness of dead layers; iii) a 6 MeV proton beam irradiation crossing the SiC detector was also performed, measuring the residual energy in a silicon detector placed downstream the SiC, to validate the SiC energy loss tables, by knowing the total thickness.

Primary experiment NUMEN

Authors

Alessandro Spatafora (INFN-LNS & Università di Catania) Dr Diana Carbone (INFN-LNS) Giuseppe Antonio Brischetto (UniCt, INFN-LNS)

Presentation materials