Speaker
Yuri Musienko
(University of Notre Dame and INR RAS (Moscow))
Description
The current understanding of radiation tolerance of Silicon Photomultipliers (SiPMs) is reviewed. Methods to characterize irradiated SiPMs after their single photo-electron resolution is lost are discussed and ideas are presented on how to approach the development of radiation hard SiPMs.
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Author
Yuri Musienko
(University of Notre Dame and INR RAS (Moscow))
