6–10 Jul 2025
Bratislava, Slovakia
Europe/Zurich timezone

Characterization of a LINAC-based Inverse Compton Scattering Source using a color X-ray camera

9 Jul 2025, 14:50
20m
Bratislava, Slovakia

Bratislava, Slovakia

Speaker

Matthieu Boone

Description

Recently, a novel design for an X-ray source based on Inverse Compton Scattering (ICS) has produced first light. Based on a linear X-band accelerator, the interaction of the electron bunch with an energy up to 25 MeV and the infrared laser pulse produced pulses of X-rays with a relatively small spectral bandwidth. The linear design is particularly useful to tune the X-ray energy, enabling methods such as K-edge imaging.
Due to the fundamental mechanism behind ICS, the spectrum of the X-ray beam exhibits a specific spatial dependency. Indeed, the spectrum is concentric, with the highest energy along the optical axis and decreasing energy further away from this axis. To investigate this behavior and characterize this novel source, the color X-ray camera or SLcam [1] has been used, directly imaging the spatial dependency of the spectrum. Figure 1 presents an illustrative RGB image, with the red channel representing 13-14 keV, green 14-15 keV and blue 15-16 keV.

In this work, we present the results of several experiments characterizing the X-ray beam as a function of a set of parameters and detail the data analysis required to visualize the results.

Workshop topics Applications

Author

Co-authors

Mr Sebastián Ignacia Allen Binet (Ghent University) Mr Coen Sweers (TU Eindhoven) Mr Ids Van Elk (TU Eindhoven) Dr Peter Mutsaers (TU Eindhoven) Mr Frederic Van Assche Dr Pieter Tack (Ghent University) Prof. Jom Luiten (TU Eindhoven)

Presentation materials