Speaker
Description
Spectral imaging in industrial CT offers significant benefits for materials analysis and artifact reduction. In this study, we demonstrate that dual-layer energy-integrating detectors (DL EIDs) provide substantial improvements over conventional flat panel detectors (FPDs) in the spectral imaging of a commercial 18650 lithium-ion battery. Using a prototype dual-layer detector (XRD4343RF-DL, Varex Imaging Corporation, Salt Lake City, USA), we reconstruct virtual monoenergetic images from energy-selective data acquired by the two scintillator layers. Compared to conventional single-layer reconstructions, these spectral images show markedly reduced beam hardening artifacts and enhanced material contrast - demonstrating the clear added value of the dual-layer approach for industrial CT.
To further assess the performance limits, the DL detector was compared with a high-resolution photon-counting detector (Thor-FX40, Varex Imaging Corporation). While the photon-counting detector (PCD) delivers superior spatial resolution and energy discriminating capabilities, it also presents significant limitations in terms of detector area (≤ 50 × 200 mm² in current systems), higher cost, and often the need for active liquid cooling. In contrast, the DL detector offers a substantially larger field of view (432 × 432 mm²), simpler system integration (passive cooling), and more accessible deployment.
Both systems successfully enabled spectral CT imaging and monoenergetic reconstruction. The PCD excels in resolution-critical applications, but the DL detector emerges as a practical and cost-efficient alternative for scenarios requiring spectral information without the technical and economic overhead of photon-counting technology. These findings highlight the dual-layer detector as a strong candidate for extending spectral imaging capabilities into broader industrial use cases.
| Workshop topics | Applications |
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