Speaker
Description
Characterizing Second-Generation High-Temperature Superconductors (2G-HTS) or REBCO Coated Conductors (CC) (RE = Rare Earth, Barium, Copper Oxide) requires multi-modal approaches to evaluate critical current density (Jc), chemical and structural uniformity, and defect distribution. Laboratory-scale methods are often limited in speed and throughput, limiting their viability for quality control and emphasizing the need for fast non-destructive techniques. We present an advanced quality control and characterization platform integrating machine vision (MV), Scanning Raman Spectroscopy (SRS) and tape height profiling into a two-dimensional (2D) reel-to-reel (R2R) system. The platform achieves fast 2D scanning of REBCO tapes, providing spatially-resolved Raman spectra, visible surface images, and mechanical characteristics such as tape curvature. Utilizing high-resolution color MV, we detect and quantify precipitates, localized defects and cracks, as well as chemical variations caused during tape fabrication. These features are directly correlated with 2D Raman maps obtained simultaneously, as well as independently collected Scanning Hall Probe Microscopy (SHPM) measurements. This provides the potential to identify features that affect (Jc) performance. Furthermore, integrated optical profiling enables measurement of tape curvature induced by residual strain, which is generally proportional to the density of artificial pinning centers. The system demonstrates reliable and repeatable performance, operating at scan rates of 10 m/h in MV mode, and 1.5 m/h in SRS mode, with the possibility of selective tape rewinding for detailed high-resolution analysis of regions of interest identified via preliminary scans. The long-term goal of this platform is to correlate fast multi-modal scanning with industry-standard critical current density measurements (Jc), significantly increasing throughput for superconductor quality control.
