Speaker
Seulgi Kim
(University of Seoul (KR))
Description
Gas Electron Multiplier detectors show excellent performance in high rate environment. However, their operation is still limited by electrical discharges. Various sources contribute to discharge formation, including manufacturing defects, dust contamination, space charge effects, and externally induced conditions. These discharges can affect detector longevity, stability, and efficiency, posing challenges for long term operation.
This talk presents a detailed study of the structural damage cased by discharges, with a focus on modification to GEM hole geometry and surface conditions. The evolution of damage under repeated discharges across a wide range of energy conditions is also discussed.
| Name of the speaker | 1 |
|---|---|
| Eligible for the Georges Charpak Young Scientist Award. | yes |
Author
Seulgi Kim
(University of Seoul (KR))
Co-author
Jason Lee
(Yonsei University (KR))