Workshop on Quality Issues in Current and Future Silicon Detectors

Name: Workshop on Quality Issues in Current and Future Silicon Detectors
Start: 2011-11-03T09:00:00+01:00
End: 2011-11-04T18:00:00+01:00
Location: CERN

3–4 Nov 2011

CERN

Europe/Zurich timezone

Overview
First Announcement
Scientific Programme
Timetable
Speaker List
Registration
Participant List
Access to CERN
Conference room location and CERN map
Accommodation
Visitors' laptop registration
Poster
- printable ver.
Workshop Dinner Info and Menu

Experience with the test and qualification of ALICE double-sided microstrip sensors

3 Nov 2011, 10:40

25m

222/R-001 (CERN)

222/R-001

CERN

Building 222-R-001

200

Show room on map

Sensors

Luciano Bosisio (Università di Trieste and INFN) Luciano Bosisio (Universita e INFN (IT))

Slides

L_Bosisio_Slides.pdf

L_Bosisio_Slides.pptx

Workshop on Quality Issues in Current and Future Silicon Detectors

Experience with the test and qualification of ALICE double-sided microstrip sensors

222/R-001

CERN

Speakers

Presentation materials

Choose timezone

Workshop on Quality Issues in Current and Future Silicon Detectors

Speakers

Presentation materials