30 May 2012 to 1 June 2012
Bari
Europe/Zurich timezone

Evaluation of electron and hole detrapping in irradiated silicon sensors

30 May 2012, 10:45
20m
Bari

Bari

Defect and Material Characterization Material and Defect Characterization

Speaker

Markus Gabrysch (CERN)

Description

Preliminary results on the extraction of detrapping time constants for both electrons and holes obtained from red laser TCT measurements. Based on DLTS scans from 10-50°C the trapping levels and cross sections were obtained for highly p-irradiated silicon diodes.

Authors

Prof. Mara Bruzzi (INFN and University of Florence) Markus Gabrysch (CERN)

Co-authors

Irena Dolenc Kittelmann (Ohio State University (US)) Marcos Fernandez Garcia (Universidad de Cantabria (ES)) Michael Moll (CERN) Nicola Pacifico (Universite Montpellier II (FR))

Presentation materials