11-15 February 2013
Vienna University of Technology
Europe/Vienna timezone

Analysis of test beam data by global optimization methods

14 Feb 2013, 11:55
20m
EI7 (Vienna University of Technology)

EI7

Vienna University of Technology

Speaker

Rudolf Fruhwirth (Austrian Academy of Sciences (AT))

Description

Successful track reconstruction in a silicon tracking device depends on the quality of the alignment, on the knowledge of the sensor resolution, and on the knowledge of the amount of material traversed by the particles. We describe algorithms for the concurrent estimation of alignment parameters, sensor resolutions and material thickness in the context of a test-beam setup. They are based on a global optimization approach and are designed to work both with and without prior information from a reference telescope. We present results from two beam tests with sensors designed for the Belle II Silicon Vertex Detector. We also discuss whether and how the global optimization approach can be transferred from a simple test-beam setup to a full-scale tracker.
quote your primary experiment Belle II

Primary authors

Are Strandlie (Fysisk institutt) Mr Christian Irmler (Austrian Academy of Sciences (AT)) Havard Ervik Gjersdal (University of Oslo (NO)) Manfred Valentan (Austrian Academy of Sciences (AT)) Dr Markus Friedl (Austrian Academy of Sciences (AT)) Rudolf Fruhwirth (Austrian Academy of Sciences (AT)) Thomas Bergauer (Austrian Academy of Sciences (AT)) Thomas Spielauer (Austrian Academy of Sciences (AT))

Presentation Materials