14–16 Nov 2012
CERN
Europe/Zurich timezone

Simulation of electric field profile in Si irradiated detectors with a consideration of carrier generation parameters

15 Nov 2012, 12:30
20m
CERN

CERN

6-2-024 on 14th & 15th Nov. 222-R-001 on 16th Nov.

Speaker

Dr Elena Verbitskaya (Ioffe Physical-Technical Institute of Russian Academy of Sciences)

Description

Impact of the parameters which define bulk generation current of Si irradiated detectors on the detector characteristics is analyzed. The electric field profile and space charge/free carrier concentrations are simulated regarding generation current and carrier generation lifetime.

Author

Dr Elena Verbitskaya (Ioffe Physical-Technical Institute of Russian Academy of Sciences)

Co-author

Dr Vladimir Eremin (Ioffe Physical-Technical Institute of Russian Academy of Sciences)

Presentation materials