Speaker
Marcela Mikestikova
(Acad. of Sciences of the Czech Rep. (CZ))
Description
N-on-p Micron diodes were irradiated with reactor neutrons to 1x1015, 2x10^15 and 1x10^16 neq/cm^2. Diodes were submitted to graduated annealing steps at 20°, 40°, 60° and 80°C to verify previously accepted accelerating annealing factors. The evolution of leakage currents and full depletion voltage (FDV) were measured. The FDV was determined from Capacity-Voltage curves and Charge Collection –Voltage curves from infrared laser beam.
Primary author
Marcela Mikestikova
(Acad. of Sciences of the Czech Rep. (CZ))
Co-authors
Jan Stastny
(Division Elementary Particle Phys.)
Dr
Peter Kodys
(Charles University)
Zdenek Kotek
(Institute of Physics)
