Speaker
Mr
Volodymyr Burkhay
(Space IC GmbH)
Description
In this paper the results of SEE tests on European Point-of-Load DC-DC converter and Extended Common Mode LVDS components using TFSMART2 technology will be presented.
TFSMART2 is an HV BCD technology on SOI with the smallest feature size of 0.35μm. During the AMICSA 2012 conference an unbiased TID radiation test of this technology using the same components has been presented.
This paper will follow-up with new results. Currently running low dose-rate biased TID test will also be presented, if finished until the conference.
Primary authors
Mr
Giorgio Magistrati
(European Space Agency)
Mr
Volodymyr Burkhay
(Space IC GmbH)
