14–16 Apr 2008
Residencia CSIC-Generalitat de Catalunya, Barcelona, Spain
Europe/Zurich timezone

Measurement of charge collection in p-type microstrip sensors with SCT128 chip

14 Apr 2008, 17:30
30m
Residencia CSIC-Generalitat de Catalunya, Barcelona, Spain

Residencia CSIC-Generalitat de Catalunya, Barcelona, Spain

Residencia de Investigadores del CSIC-Generalitat de Catalunya Carrer Hospital, 64. E08001, Barcelona, Spain
Radiation hardness properties of p-type substrate silicon micro-strip detectors: neutron and proton irradiations P-type strip detectors 3

Speaker

Igor Mandic (Jožef Stefan Institute)

Description

A setup for measurements with SCT128 chip was built in Ljubljana. First results of charge collection measurements with this setup will be presented. Measurements were made with miniature p-type microstrip sensors with n-side readout from Micron. Sensors were irradiated with neutrons up to 1 MeV equivalent fluence of 3e15 n/cm2.

Author

Igor Mandic (Jožef Stefan Institute)

Co-authors

Gregor Kramberger (Jožef Stefan Institute) Marko Mikuž (University of Ljubljana and Jožef Stefan Institute) Vladimir Cindro (Jožef Stefan Institute)

Presentation materials