-
14:30
Study on the Total Ionizing Dose Effects of SiGe HBTs Irradiated with 60Co γ Rays
-
Zheng Li
(Xiangtan University, Xiangtan, Hunan ,411105, China)
-
14:40
Simulation of Synergistic Effects on Lateral PNP Bipolar Transistors induced by Neutron and Gamma Irradiation
-
Chenhui Wang
(Northwest Institute of Nuclear Technology of China,Xi’an 710024,China)
-
14:50
Radiation tests of pixel readout chip designed in 40nm CMOS technology
-
Tadeusz SATŁAWA
-
15:00
ATLAS Pixel IBL modules construction experience and developments for future upgrade
-
Andrea Gaudiello
(Univerisyt of Genova and INFN)
-
15:10
Development of a bidimensional dosimeter for IMRT based on polycrystalline diamond
-
Margherita Zani
(Universita' di Firenze)
Monica Scaringella
(University of Firenze, Italy)
-
15:20
Belarusian HPHT diamonds. Material properties and detector characteristics
-
Leonid Makarenko
(Belarusian University, Minsk)
-
15:30
Primary Experimental Radiation Effects Results of 28 Nanometer Configuration System-on-Chip(Xilinx Zynq-7010 SoC)
-
Shuhuan Liu
(School of Nuclear Science and Technology, Xi’an Jiaotong University, Xi’an, Shaanxi, 710049,P.R. China)
-
15:40
Simulation of Single Event Upset in SRAMs Induced by low Energy Proton With Geant4
-
yonghong li
(xi’an jiaotong university)
-
15:50
Primary Design and Numerical Simulation Studies on 3D Si SOI Microdosimeter
-
Shuhuan Liu
(School of Nuclear Science and Technology, Xi’an Jiaotong University, Xi’an, 710049, China)
