20-22 May 2015
Asia/Bangkok timezone
The Centennial Celebration of General Relativity Theory and 80 Years of Thai Physics Graduate

Development of MeV Carbon-ion PIXE

20 May 2015, 14:00
3h 30m
Board: PLA-04
Poster presentation Ion and Plasma Physics Poster-1

Speakers

Mr Chaiyon Chaiwai (Department of Physics and Materials Science, Faculty of Science, Chiang Mai University, Chiangmai, 50200, Thailand)Dr Udomrat Tippawan (Department of Physics and Materials Science, Faculty of Science, Chiang Mai University, Chiangmai, 50200, Thailand)Dr Yu Liangdeng (Thailand Center of Excellence in Physics, Si Ayutthaya Road,Bangkok 10400,Thailand)

Description

In development of MeV heavy-ion particle induced X-ray emission (PIXE) technology which has been demonstrated to be superior to conventional light proton PIXE owing to larger cross sections, MeV carbon-ion PIXE was tested and studied for availability and cross sections. The relatively low ion energy range around 1 MeV for C-ion PIXE had never been investigated before. In the work, C-ion PIXE at ion energy around 1 MeV was firstly tested and demonstrated to be available at our 1.7-MV tandem accelerator and its beam line. In measurement of the cross sections for the MeV C-ion PIXE, 0.8, 1.0 and 1.2 MeV C-ion beams were applied to analyze materials of Si, Fe, Cu, Zn and Au and the spectra were compared with spectra of 1.0- and 2.0-MeV proton PIXE. Results showed that at the same low ion energy of 1 MeV, C-ion PIXE yields were significantly higher by orders than those of proton PIXE which were actually negligible, demonstrating the former significantly more sensitive than the latter. With the 2-MeV proton PIXE cross sections used as the reference, the MeV C-ion PIXE cross sections were calculated. An interesting trend of the cross section against the atomic number Z showed that the cross sections of MeV C-ion PIXE compared with those of proton PIXE for the analyzed materials had a transition around Cu. For lower Z the former was higher than the latter, while for higher Z the former was lower than the latter, indicating MeV C-ion PIXE more sensitive in detecting lower-Z elements. Detailed experimental and calculating methods as well as discussions are reported in the presentation.

Primary author

Mr Chaiyon Chaiwai (Department of Physics and Materials Science, Faculty of Science, Chiang Mai University, Chiangmai, 50200, Thailand)

Co-authors

Dr Udomrat Tippawan (Department of Physics and Materials Science, Faculty of Science, Chiang Mai University, Chiangmai, 50200, Thailand) Dr Yu Liangdeng (Thailand Center of Excellence in Physics, Si Ayutthaya Road,Bangkok 10400,Thailand)

Presentation Materials

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