10th International "Hiroshima" Symposium on the Development and Application of Semiconductor Tracking Detectors, Xi'an, China

The new low-capacitance silicon pixel detector performance simulation

26 Sept 2015, 19:03

1m

Multi-function Hall (International Conference Center (Nanyang Hotel))

POSTER Simulations and Manufacturing After dinner POSTER session, with drinks: (All presenters are requested/encouraged to attend their posters; All participants are requested to participate the session, with drinks!)

Speaker

Xiong Bo (Xiangtan University)

Description

In order to obtain the high sensitivity Silicon Pixel Tracker(SPT), we gain the low capacitance which can reduce noise and improve signal-noise ratio through modeling and simulating the different type of the junction electrode structure by Sivalco TCAD. Then we get the electrical performance of capacitance, leakage current, electron concentration and electric field distribution. Through the simulation, we can predict and design new low capacitance SPT.