Speaker
Dr
Vladimir Eremin
(Ioffe Institute, St. Petersburg)
Description
The negative feedback in silicon heavily irradiated detectors is a basic mechanism which governs the detector performance [V. Eremin, et al., NIM A 658 (2011) 145]. The talk presents a comparative study of the mechanism in P+-I-N+ and Low Gain Avalanche Diodes (LGAD) utilizing the classic structure of avalanche photodiodes performed in the fluence range up to 1x10^15 neq/cm2. The analytical evaluations are applied to express the major trends of the voltage and fluence dependences of the detector parameters.
Primary author
Dr
Vladimir Eremin
(Ioffe Institute, St. Petersburg)
Co-author
Elena Verbitskaya
(Ioffe Institute, St. Petersburg)
