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09:00
IV-characterization of silicon sensors irradiated up to 2E16neq/cm^2
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Sven Wonsak
(University of Liverpool (GB))
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09:20
The effective bandgap and current related damage rate of highly irradiated silicon sensors
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Moritz Wiehe
(Albert-Luwdigs-University Freiburg)
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09:40
Drift Mobility and Electric Field in Silicon Detectors Irradiated with Neutrons and Protons up to 1E17 n_eq/cm^2 [Thu/Friday]
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Marko Mikuz
(Jozef Stefan Institute (SI))
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10:00
Analysis of TCT measurements of highly irradiated silicon pad diodes under forward bias
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Christian Scharf
(Hamburg University (DE))
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10:20
Tests of the Signal from Minimum Ionising Particles of 50µm Thick Silicon Micro-Strip Sensors after Extreme Fluences above 3E16 Neq cm^2
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Gianluigi Casse
(University of Liverpool (GB))
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10:40
Discussion Session on High Fluence Effects/Radiation
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Eckhart Fretwurst
(II. Institut fuer Experimentalphysik)
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11:20
Status of CNM developments on LGAD and iLGAD detectors
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Salvador Hidalgo
(Centro Nacional de Microelectronica (IMB-CNM-CSIC))
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11:50
Characterization of LGAD sensors from CNM Run 7062
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Isidro Mateu Suau
(Centro de Investigaciones Energ. Medioambientales y Tecn. - (ES)
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12:00
Characterization of LGAD sensors from CNM Run 7859
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Sofia Otero Ugobono
(Universidade de Santiago de Compostela (ES))
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12:20
Negative feedback in Si detectors with avalanche multiplication
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Vladimir Eremin
(Ioffe Institute, St. Petersburg)
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12:40
Timing resolution of 300-micron thick LGAD sensors from CNM at testbeam and comparison with simulation.
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Nicolo Cartiglia
(Universita e INFN Torino (IT))
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13:00
Reading out thin LGADs
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Hartmut Sadrozinski
(University of California,Santa Cruz (US))