Dec 2 – 4, 2015
CERN
Europe/Zurich timezone

Status of E-TCT measurements with HV-CMOS test structures

Dec 2, 2015, 2:40 PM
20m
6/2-024 - BE Auditorium Meyrin (CERN)

6/2-024 - BE Auditorium Meyrin

CERN

6-2-024
114
Show room on map
Standard (20 min including discussion) CMOS sensors and Sensor Producers

Speaker

Igor Mandic (Jozef Stefan Institute (SI))

Description

TCT measurements with focused laser beam were recently made with test structures from different producers of HV-CMOS detectors. The test structures are processed on substrate with different resistivities. In this contribution we will compare TCT measurements with these structures before and after irradiation.

Author

Igor Mandic (Jozef Stefan Institute (SI))

Presentation materials