14th RD50 Workshop

Bias on-off proton irradiation results on MCz-Si and Fz-si detectors

3 Jun 2009, 17:20

20m

Freiburg, Germany

Pad Detector Characterization and Defect Engineering

Speaker

Jasu Haerkoenen (Helsinki Institute of Physics HIP)

Presentation materials

Slides

11_Harkonen_et_al_14th_RD50_workshop.pdf