Signals from fluorescent materials on the surface of silicon micro-strip sensors

10 Dec 2017, 21:14
1m
Conference Center (Okinawa Institute of Science and Technology Graduate University (OIST))

Conference Center

Okinawa Institute of Science and Technology Graduate University (OIST)

OIST, Onna, Okinawa 904-0495, Japan
POSTER New ideas and future applications POSTER

Speaker

Dennis Sperlich (Humboldt University of Berlin (DE))

Description

For the High-Luminosity Upgrade of the Large Hadron Collider at
CERN, the ATLAS Inner Detector will be replaced with a new, all-silicon
tracker. In order to minimise the amount of material in the detector,
circuit boards with readout electronics will be glued on to the active area of
the sensor. Several adhesives investigated to be used for the construction
of detector modules were found to become fluorescent when exposed to UV
light. These adhesives could become a light source in the high-radiation
environment of the ATLAS detector.

The effect of fluorescent material covering the sensor surface in a high-
radiation environment has been studied for a silicon micro-strip sensor
using a micro-focused X-ray beam. By pointing the beam both inside the
sensor and parallel to the sensor surface, the sensor responses from direct
hits and fluorescence can be compared with high precision.

This contribution presents a setup to study the susceptibility of silicon
strip sensors to light contamination from fluorescent materials and shows
their impact on the noise and fake signal rate of a sensor operated in a
high-radiation environment.

Primary authors

Luise Poley (Deutsches Elektronen-Synchrotron (DE)) Dennis Sperlich (Humboldt University of Berlin (DE))

Co-authors

Laura Rehnisch (Humboldt University of Berlin (DE)) Martin Stegler (Deutsches Elektronen-Synchrotron (DE)) Andrew Blue (University of Glasgow (GB))

Presentation materials