Improvements of Grating-based X-ray Phase Contrast Imaging with a Microfocus X-ray Source by a SOI Pixel Detector, SOPHIAS

10 Dec 2017, 21:21
1m
Conference Center (Okinawa Institute of Science and Technology Graduate University (OIST))

Conference Center

Okinawa Institute of Science and Technology Graduate University (OIST)

OIST, Onna, Okinawa 904-0495, Japan
POSTER SOI detectors POSTER

Speaker

Ryo Hosono (Osaka University)

Description

X-ray absorption radiography with a microfocus x-ray source plays an important role in a variety of fields, including industrial application, materials science, and biology, because it enables nondestructive observation of the inside of materials in high spatial resolution. Recently x-ray phase-contrast imaging (XPCI) and small-angle scattering (SAS) imaging have been demonstrated using several techniques to enhance the contrast of light element materials. Among them, the method utilizing a single-amplitude grating is very attractive, because we can freely set optical parameters such as source-grating and grating-detector distances independent of x-ray energy.
In this paper, we demonstrate two improvements of this method utilizing the advantages of a silicon-on-insulator (SOI) pixel detector, SOPHIAS[1]. The detector enables to estimate the energy and incident position of individual x-ray photons. One is single-exposure energy-resolved XPCI, and the other is the improvement in spatial resolution of SAS imaging. In the XPCI, absorption and phase-contrast images of polymethyl methacrylate (PMMA) and Si spheres were obtained for 8- and 15-keV x-rays from single-exposure data, which is very useful in material characterization. Analyzing electric charge generated by x-ray photon irradiation near pixel boundary improved spatial resolution of SAS images in addition to the enhancement of signal-to-noise ratio of XPCI.
[1] T. Hatsui et.al., Proceedings of International Image Sensor Workshop, Article 3.05 (2013).

Primary author

Ryo Hosono (Osaka University)

Co-authors

Mr Daisuke Tsukamoto (Osaka University) Mr Tomoki Kawabata (Osaka University) Dr Kiyoshi Hayashida (Osaka University) Dr Togo Kudo (JASRI & RIKEN) Mr Kyosuke Ozaki (RIKEN) Dr Takaki Hatusi (RIKEN) Prof. Nobukazu Teranishi (University of Hyogo) Dr Takuji Hosoi (Osaka University) Prof. Heiji Watanabe (Osaka University) Dr Takayoshi Shimura (Osaka University)

Presentation materials