Prof.
KEK
Author in the following contributions
- Development and performance of double SOI pixel sensors
- Prototype of a 250 µm Pitch 36-Channel Silicon Photo Multiplier Array Using Silicon on Insulator Technology for Photon Counting Computed Tomography
- Development of Debye-Ring Measurement System Using SOI Pixel Detector
- Development of new high-speed readout system for SOI pixel detectors
- Investigation of Radiation Hardness Improvement by Applying Back-gate Bias for FD-SOI MOSFETs
- X-ray response evaluation in subpixel level for X-ray SOI pixel detectors
- Proton Radiation Damage Experiment for X-ray SOI Pixel Detectors
- Linear mode reach through APD for X-ray imaging in 0.2μm SOI-CMOS technology
- Application of a monolithic SOI pixel detector to evaluation of strength of industrial materials
