Session

Session9

13 Dec 2017, 09:00
Conference Center (Okinawa Institute of Science and Technology Graduate University (OIST))

Conference Center

Okinawa Institute of Science and Technology Graduate University (OIST)

OIST, Onna, Okinawa 904-0495, Japan

Conveners

Session9

  • Angelo Rivetti (Universita e INFN Torino (IT))

Presentation materials

There are no materials yet.

  1. Federico Faccio (CERN)
    13/12/2017, 09:00
    Technologies
    ORAL

    The first decade of the century was characterized by a very successful development of radiation-tolerant ASICs in a commercial quarter micron CMOS process, and very promising measurements on commercial-grade 130nm technologies. A straightforward path for the design and integration of ASICs tolerant to ultra-high radiation levels seemed to be wide open. This was without counting on the...

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  2. Hideyuki Oide (INFN-Genova)
    13/12/2017, 09:30
    Pixel sensors for tracking
    ORAL

    3D sensors are a promising option for the innermost pixel layers at the High
    Luminosity LHC. However, the required very high hit-rate capabilities,
    increased pixel granularity, extreme radiation hardness, and reduced
    material budget call for a device downscale as compared to existing 3D
    sensors, involving smaller pitch (e.g., 50×50 or 25×100 µm2 ), shorter
    inter-electrode spacing (~30 µm),...

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  3. Joern Lange (IFAE Barcelona)
    13/12/2017, 09:50
    Radiation damage and radiation tolerant materials
    ORAL

    3D silicon detectors, with cylindrical electrodes that penetrate the sensor bulk perpendicularly to the surface, present a radiation-hard sensor technology. Due to a reduced electrode distance, trapping at radiation-induced defects is less and the operational voltage and power dissipation after heavy irradiation are significantly lower than for planar devices. During the last years, the 3D...

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  4. Makoto Motoyoshi (Tohoku-MincroTec Co., Ltd (T-Micro))
    13/12/2017, 10:10
    Technologies
    ORAL

    A 3D-IC is an effective solution for reducing the manufacturing costs of advanced 2D LSI while ensuring equivalent device performance and functionalities. This technology allows for a new device architecture of stacked detectors/sensor devices with a small dead sensor area and facilitates hyper-parallel data processing. In pixel sensors and detectors, many transistors must be accommodated...

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