Conveners
Session15
- Toru Tsuboyama (KEK, High Energy Accelerator Research Organization)
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Mr Longlong Song (Institute of High Energy Physics)15/12/2017, 08:40SOI detectorsORAL
Digital pickup is a critical issue to pixel detectors. SOI technology suffered much from it due to the capacitive coupling between sensing electrode and pixel circuit, insulated by a thin layer of SiO2. In order to tackle this issue, an advanced process called Double-SOI has been developed and many prototype chips have been submitted to this process. Among them, the design of CPIXTEG3b is...
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Ryutaro Nishimura (The Graduate University for Advanced Studies (KEK))15/12/2017, 09:00SOI detectorsORAL
We are developing new high-speed readout system for Silicon-On-Insulator (SOI) Pixel Detectors. The SOI detector is a monolithic radiation imaging detector based on a 0.2um FD-SOI CMOS process. As before, we used Xilinx Virtex-4/5 FPGA readout board for SOI detector, and developed many facilities for this board. However, Virtex-4/5 FPGA is now obsoleted and does not have enough performance for...
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Yoshio Kamiya (University of Tokyo (JP))15/12/2017, 09:20SOI detectorsORAL
The Weak Equivalence Principle (WEP) is one of the fundamental concepts of the theory of General Relativity. It has long been subjected to experimental tests, and possible anomalies are evaluated using the ratio of inertial and gravitational masses or the Eotvos parameter. However, most experimental tests have been performed in the classical regime and only few tests have been attempted in the...
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Yoshiyuki Onuki (University of Tokyo)15/12/2017, 09:40SOI detectorsORAL
A solution to the strong CP problem was proposed by introducing a pseudoscalar particle, the Axion, in 1977. Both the experimental constraints and the theoretical predictions have been made by various approaches in Particle physics, Astrophysics and Cosmology so far.
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We discuss configuration of the Solar Axion search experiment with a 57Fe foil, as an Axion-photon converter, sandwiched pixel... -
Dr Shingo Mitsui (Kanazawa university)15/12/2017, 10:00SOI detectorsORAL
In recent industrial sites of the fabricated metal product manufacturing, total inspection of residual stress or hardness in non-destructive non-contact is required. However, the conventional measurement system only used in a sampling inspection because it takes a long time to measure. Therefore, we are developing high speed Debye-ring measurement system using integration-type SOI pixel...
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