Endohedral fullerene is expected to be utilized for such applications as quantum computing or magnetic resonance imaging contrast agent, because it has various material characters . It is confirmed that multiply charged fullerene ion beam has been produced in electron cyclotron resonance ion source (ECRIS) at Osaka Univ. . However, it can’t be simply identified because spectrum of multiply charged fullerene ions overlaps dissociated single charged fullerene ions. Therefore, production of multiply charged fullerene ions can be confirmed by identifying non-overlapping fullerene ions spectrum.
The aim of this paper is to investigate production of multiply charged fullerene ions in the ECRIS. As a result, multiply charged fullerene ions have been identified and isolated isolated from dissociated ones clearly. In addition, we are planning to report the result of identifying another ion beams relevant to C60 compounds.
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