Speaker
Description
A singly charged ion delivery system has been designed and constructed for the purpose of charged ion injection into the Electron String Ion Source (ESIS) at JINR, Dubna, Russia. [1], [2]. A Liquid Metal Ion Source (LMIS) is used to produce Ga$^{+}$ and Au$^{+}$ ions which are transported through a beam-line system consisting of charged particle optics [3]: Focusing Einzel-lenses, an electrical quadrupole switchyard for 90° beam bending and subsequent correction and focusing lenses before the entry port into the ESIS. Up to date, a mock-up of the full system has been created and used to study the injection process and ion transport efficiency, as well as the subsequent extraction of ions using reflected singly charged ions from the mock-up ESIS entry port. A multi-wire “Harp” beam profilometer has been used to study ion beam profiles and to obtain beam parameters of an injected and extracted Ga$^{+}$ ion beam. The results are summarized within this poster report.
References
[1] E.D. Donets, et. al., Rev. Sci. Instrum., Vol. 75, 1543-1545 (2004).
[2] E.D. Donets, et. al., Rev. Sci. Instrum., Vol. 83, No 2, Part 2, 02A512 (2012).
[3] M. J. Segal, et. al., Rev. Sci. Instrum., Vol. 87, Part 2, 02A913 (2016).
