The external beam line for the Twin Electron Beam Ion Source (EBIS) is intended for transmission of highly charged ions extracted from EBIS for consequent injection into a high-frequency RFQ, and for general diagnostics of ion beams being extracted from or injected into the EBIS. For medical or industrial applications it can be mostly light ions with charge to mass ratio of 0.5 – 0.4. The extracted beam can also be directed into a Time Of Flight mass-spectrometer (TOF). An optional injection of ions from an external ion source into the EBIS is foreseen. The electrostatic switchyard provides fast change of the ion beam direction. Special care is taken of the quality of the focusing elements and the bending in terms of acceptance and spherical aberrations. Simulations of ion extraction and injection are presented along with details of the LEBT design.