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26–28 Nov 2018
CERN
Europe/Zurich timezone

Annealing and Characterization of Irradiated Low Gain Avalanche Detectors

27 Nov 2018, 12:00
20m
6/2-024 - BE Auditorium Meyrin (CERN)

6/2-024 - BE Auditorium Meyrin

CERN

6-2-024
114
Show room on map

Speaker

Moritz Oliver Wiehe (CERN / Albert Ludwigs Universitaet Freiburg (DE))

Description

Irradiated Low Gain Avalanche Detectors (LGADs) are investigated using the
Transient Current Technique (TCT). The sensors are irradiated to a fluence of $10^{14}$ $\mathrm{n_{eq}}$/$\mathrm{cm}^2$. For different annealing times (at 60°C), the collected charge, the gain and the
electric field profile is measured.

Primary author

Moritz Oliver Wiehe (CERN / Albert Ludwigs Universitaet Freiburg (DE))

Presentation materials