26-28 November 2018
Europe/Zurich timezone

Charge collection test and TCAD simulation of OVERMOS, a CMOS 180nm MAPS detector

27 Nov 2018, 14:10
6/2-024 - BE Auditorium Meyrin (CERN)

6/2-024 - BE Auditorium Meyrin


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Dr E. Giulio Villani (STFC Rutherford Appleton Laboratory) Enrico Giulio Villani (Science and Technology Facilities Council STFC (GB)) Enrico Giulio Villani (STFC - Science & Technology Facilities Council (GB)) Giullio villani (Rutherford Appleton Laboratory)


We will present results of charge collection of OVERMOS, a high resistivity TJ 180nm CMOS MAPS, obtained using 1064 nm calibrated laser source.
Result include charge collection over pixel region, sampled with 5 um resolution, and charge collection time. Test results are compared with 3D TCAD optical simulations, taking into account SiO2 and CoSi2 attenuation.

Primary authors

Dr E. Giulio Villani (STFC Rutherford Appleton Laboratory) Dr Jens Dopke (Rutherford Appleton Laboratory) Dr M. Marcus French (Rutherford Appleton Laboratory) Prof. Stephen McMahon (Rutherford Appleton Laboratory) Dr Iain Sedgwick (Rutherford Appleton Laboratory) Dr Paul Seller (Rutherford Appleton Laboratory) Prof. Fergus Wilson (Rutherford Appleton Laboratory) Dr Zhige Zhang (Rutherford Appleton Laboratory) Prof. Steve Worm (University of Birmingham) Dr Zhijun Liang (Institute of High Energy Physics,CAS) Prof. Hongbo Zhu (Institute of High Energy Physics,CAS) Prof. Qing lei Xiu (Institute of High Energy Physics,CAS)

Presentation Materials