Speaker
Eli Engelberg
(The Hebrew University of Jerusalem)
Description
We present a model in which electrical breakdown in high-voltage systems is caused by a critical transition, due to stochastic fluctuations of the mobile dislocation population in the cathode. Recent developments of the model, due to comparison with experiment and microscopic observations, are described. We propose a number of additional experiments to validate the model, and discuss its applications. Additionally, we describe atomic simulations of the experimental scenarios and their implications for the model.
Authors
Eli Engelberg
(The Hebrew University of Jerusalem)
Mrs
Ayelet Badichi Yashar
(The Hebrew University of Jerusalem)
Yinon Ashkenazy
(The Hebrew University of Jerusalem)
Prof.
Michael Assaf
(The Hebrew University of Jerusalem)
Inna Popov
(The Hebrew University of Jerusalem)