Sep 20 – 24, 2010
Aachen, Germany
Europe/Zurich timezone



Sep 22, 2010, 5:30 PM
Aachen, Germany

Aachen, Germany

RWTH Aachen University Templergraben 55 52056 Aachen



  • Mitch Newcomer (University of Pennsylvania)


At the conclusion of TWEPP presentations Wednesday afternoon, there will be a short Micro Electronics User Group (MUG) meeting followed by an ASIC designers working group meeting to discuss Single Event Effects (SEE) in the next generation experiments with high radiation levels. Dealing with single event effects covering Single Event Upset (SEU), Single Event Transients (SET), Single Event Latchup (SEL) and Single Event Functional Interrupts (SEFI) will be an increasingly difficult challenge when using modern ASIC technologies with low power supply voltages. Deep submicron IC technologies with low power consumption are getting increasingly sensitive to single event effects and this must therefore be taken carefully into account both at the system level and the ASIC design level. This working group meeting will be an initial forum within the high energy physics community to share acquired knowledge and experience in this particular domain. Our current knowledge and experience with SEE’s will be introduced and summarized by a few presentations followed by an open discussion among the working group participants.

Presentation materials

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Federico Faccio (CERN), Dr Sandro Bonacini (CERN)
9/22/10, 5:30 PM
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