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24–29 May 2020 Postponed
America/Vancouver timezone

Improvements of DePFET sensor technology

28 May 2020, 14:54
18m
Parallel session talk Sensors Sensors: Solid-state position sensors

Speaker

Jelena Ninkovic (Max Planck Society Semiconductor Laboratory)

Description

The DePFET is an active pixel sensor first introduced in 1987 (Kemmer&Lutz NIMA 1987) and is utilized in and suggested for experiments in astrophysics, planetary exploration as well as particle physics. The DePFET is essentially a pMOSFET built on a high resistive, fully depleted bulk. A deep-n implant beneath the MOS-gate forms a positive potential. Electrons are collected in this “internal gate” and modulate the transistors conductivity. Geometry and operational parameters influence the gq i.e. the DePFETs “charge gain”. Recently we developed a new technology that offers a significant increase of signal to noise ratio. With respect to simulation results, these super gq DePFETs will have a charge gain about 3-4 time larger than standard DePFET devices without increasing the DePFETs effective noise. A test production is currently ongoing. Herein we will present the new Technology and discuss the expected improvements.

Primary author

Co-authors

Laci Andricek (MPG Semiconductor Lab) Peter Lechner (MPG HLL) Jelena Ninkovic (Max Planck Society Semiconductor Laboratory) Rainer Richter (Halbleiterlabor der MPG) Florian Schopper (Max-Planck Institutes (in MetaDir of GWDG)) Johannes Treis (MPG Semiconductor Laboratory)

Presentation materials

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