CERN
Author in the following contributions
- Investigation of the BiOi defect in EPI and Cz silicon diodes using Thermally Stimulated current (TSC) and Thermally Stimulated Capacitance (TS-Cap)
- Defect characterization studies on highly irradiated Low Gain Avalanche Detectors
- Non-Ionizing Energy Loss: Geant4 simulations towards more advanced NIEL concept for radiation damage modelling and prediction
