Speaker
Lukas Alexander Heinrich
(CERN)
Description
The design of optimal test statistics is a key task in frequentist statistics and for a number of scenarios optimal test statistics such as the profile-likelihood ratio are known. By turning this argument around we can find the profile likelihood ratio even in likelihood-free cases, where only samples from a simulator are available, by optimizing a test statistic within those scenarios. We propose a likelihood-free training algorithm that produces test statistics that are equivalent to the profile likelihood ratios in cases where the latter is known to be optimal.
Primary author
Lukas Alexander Heinrich
(CERN)
