41st RD50 Workshop on Radiation Hard Semiconductor Devices for Very High Luminosity Colliders (Sevilla, Spain)

Session

Wide Band Gap Materials

WBG

30 Nov 2022, 09:00

Salón de Grados, 2nd Floor (ETSI Seville)

39. TCT Study on the effect of epitaxial graphene contacts in SiC detectors

Ivan Lopez Paz (The Barcelona Institute of Science and Technology (BIST) (ES))

30/11/2022, 09:00

Silicon Carbide has interesting properties for high temperature, high radiation environment and timing radiation detector applications due to its thermal conductivity (3.7 W/(cm.°C)), atomic displacement threshold (22-35 eV) and high saturation velocity (2.2e7 cm/s). Silicon Carbide detector diodes have been fabricated in IMB-CNM with epitaxially-grown graphene onto Silicon Carbide (EG-SiC) as...

43. 4H-SiC devices simulation with DEVSIM

Xiyuan Zhang (Institute of High Energy, CAS)

30/11/2022, 09:20

4H-SiC devices could potentially operate in a harsh radiation and room-temperature environment because of its wider band gap, atomic displacement threshold energy and high thermal conductivity. We have simulated the IV, CV characteristics and gain efficiencies of 4H-SiC devices based on DEVSIM——an open source TCAD semiconductor device simulator. The reliability of the software can be verified...

45. SiC for Proton Beam Monitor

Ye He (Institute of High Energy, CAS)

30/11/2022, 09:40

Silicon carbide is a new type of semiconductor, and it is widely used in
optoelectronic devices, power electronic devices and other fields. Compared to
silicon semiconductor, silicon carbide has wider band gap, higher breakdown electric field, higher thermal conductivity and can stand greater irradiation.

We are planning to use silicon carbide device to make a proton beam monitoring...

75. Update on the characterization of neutron irradiated IMB-CNM SiC planar diodes

Cristian Quintana San Emeterio (Universidad de Cantabria and CSIC (ES))

30/11/2022, 10:00

A radiation tolerance study of planar diodes fabricated on a SiC substrate will be presented. TPA-TCT and TRIBIC methods were used to characterize the samples. The measurement campaign was carried out at the laser facility of the EHU-UPV university and the CNA microbeam.

36. Silicon Carbide LGAD RD50 common project

Thomas Bergauer (Austrian Academy of Sciences (AT))

30/11/2022, 10:50

Silicon Carbide (SiC) has been known for more than 100 years and was investigated as detector material already 20 years ago. Nowadays, it gets again attention and momentum since the chip industries started to use SiC as substrate material for energy-efficient power devices to foster the energy revolution.
Silicon Carbide particle detectors have some advantageous properties compared to...

72. Discussion

Dr Giulio Pellegrini (Centro Nacional de Microelectrónica (IMB-CNM-CSIC) (ES))

30/11/2022, 11:10

61. Discussion