Speaker
Cristian Quintana San Emeterio
(Universidad de Cantabria and CSIC (ES))
Description
A radiation tolerance study of planar diodes fabricated on a SiC substrate will be presented. TPA-TCT was used to characterize the samples. The measurement campaign was carried out at the laser facility of the EHU-UPV university.
Authors
Cristian Quintana San Emeterio
(Universidad de Cantabria and CSIC (ES))
Dr
Ivan Vila Alvarez
(Instituto de Física de Cantabria (CSIC-UC))
Raul Montero
Marcos Fernandez Garcia
(Universidad de Cantabria and CSIC (ES))
Co-authors
Esteban Curras Rivera
(CERN)
Richard Jaramillo Echeverria
(Universidad de Cantabria and CSIC (ES))
Michael Moll
(CERN)
Francisco Rogelio Palomo Pinto
(Universidad de Sevilla (ES))
Sebastian Pape
(Technische Universitaet Dortmund (DE))
Giulio Pellegrini
(Centro Nacional de Microelectrónica (IMB-CNM-CSIC) (ES))
Joan Marc Rafí
(Consejo Superior de Investigaciones Cientificas (CSIC) (ES))
Gemma Rius
