Speaker
Mohammadtaghi Hajheidari
(Hamburg University (DE))
Description
In this work, charge collection profiles of non-irradiated and irradiated $150 \; \mu \text{m}$ $p$-type pad diodes were measured using a $5.2 \; \text{GeV}$ electron beam traversing the diode parallel to the readout electrode. Four diodes were irradiated to $1 \; \text{MeV}$ neutron equivalent fluences of 2, 4, 8, and $12 \times 10^{16} \; \text{cm}^{-2}$ with $23 \; \text{MeV}$ protons. By unfolding the measured charge collection profiles, the Charge Collection Efficiency profiles are extracted as a function of depth. The results of the measurements are compared to the simulation using three radiation damage models from literature which were tuned to different irradiation types and fluences.
Author
Mohammadtaghi Hajheidari
(Hamburg University (DE))
