Speaker
Description
High reliability is an essential requirement for all spaceflight hardware. XRISM, a follow-on mission to the Hitomi x-ray observatory, also uses 2G REBCO tapes as current leads for the superconducting magnets that are a key component of the Adiabatic Demagnetization Refrigerator (ADR) that cools the detector array. While the Hitomi Soft X-ray Spectrometer (SXS) worked flawlessly in orbit, during its development there were indications that the critical current of its specialized REBCO tapes could degrade over time when exposed to normal-humidity air. To demonstrate that the updates to the XRISM HTS lead assemblies had mitigated this risk, a series of tests were carried out to measure the stability of Ic of dozens of samples over a period greater than the flight assemblies were exposed to air during integration and test. The test rig allowed not only the measurement of the sample Ic, but also the localization of the voltage rise as the current approached Ic. We will discuss the trends in the critical current of the samples, as well as localization of lower Ic regions.
