Speaker
Guillaume Beuf
Description
In this talk, we will discuss the back-to-back limit of the DIS dijet production at next-to-eikonal accuracy computed in a highly boosted gluon background field within the Color Glass Condensate (CGC) framework. We will show that the various types of next-to-eikonal corrections can be written as field strength insertions on the CGC Wilson lines which provide direct relation with the gluon TMDs defined from the two-point correlators of the field strength. We will then discuss the interplay between the subeikonal corrections in the CGC and the higher twist corrections in the TMD factorization.
Submitted on behalf of a Collaboration? | No |
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Primary authors
Tolga Altinoluk
Guillaume Beuf
Alina Czajka
(National Centre for Nuclear Research)
Cyrille Marquet
(CPHT - Ecole Polytechnique)