Speaker
Description
The goal of the TANGERINE project is to develop the next generation of monolithic silicon pixel detectors using a 65 nm CMOS imaging process, which offers a higher logic
density and overall lower power consumption compared to currently utilized feature sizes.
The Analogue Pixel Test Structure (APTS) are sensors designed and developed by ALICE with readout boards developed by CERN EP R&D using a 65 nm imaging process to study the capabilities of this technology. In order to study the temporal development of charge collection, the sensor is tested at the DESY-II test beam facility. For each hit produced by an incident particle, the analogue signal output is recorded using an oscilloscope and analyzed offline, including information from the track reconstruction. The results of this analysis are compared with studies obtained through Technology
Computer-Aided Design (TCAD) and Monte Carlo (MC) simulations. Through the use
of generic doping profiles, the electric fields and electrostatic potentials are calculated
with TCAD and imported into the Allpix Squared framework which allows high statistic
and realistic simulations.
In this contribution, the sensor and setup, results obtained at the DESY-II Test Beam
facility, laboratory characterization measurements using Fe-55 and a comparison with
simulations will be presented