GB-RADNEXT Workshop 2024

Session

Session 4: Alternative Probes for SEE Testing

13 Jun 2024, 09:10

Visitor Center, Rutherford Appleton Laboratory, United Kingdom

56. Session introduction

Chair: Camille Bélanger-Champagne (TRIUMF)

13/06/2024, 09:10

23. Talk 1: Laser-driven beams for radiation-to-electronics study

Roberto Versaci (ELI ERIC)

13/06/2024, 09:15

Abstract:

This contribution will discuss the possibility to study radiation damage to electronics in high energy laser facility. The main characteristics as well as the inherent limitations of the laser-driven beams will be presented in order to assess the overall maturity of the technology will be assessed. The relevance for laser facilities of the radiation damage to electronics induced...

24. Talk 2: How synchrotron light sources can help overcome the major limitations related to Heavy Ions Single Event Effects testing in electronic circuits

Ennio Capria (ESRF)

13/06/2024, 09:35

Abstract:

Traditionally, heavy ion (HI) tests for Single Event Effects (SEE) qualification are conducted at cyclotron facilities with energies around 10 MeV/n. However, this testing method presents several drawbacks. Firstly, a demanding sample preparation is needed to probe the sensitive part of the component, which may not be possible for novel flip chip bonding technologies or 3D...

26. Talk 3: How pulsed laser SEE testing aids the space qualification of EEE components

Richard Sharp (Radtest)

13/06/2024, 09:55

Abstract:

As access to heavy ion beam time for radiation testing has become increasingly difficult during recent years, interest in using pulsed lasers to quantify single-event effect rates has steadily grown. Whilst there are limits to the types of device that can be tested with a laser, the technique offer numerous benefits for screening and de-risking, while offering the potential for...

25. Talk 4: Muon-induced Soft Errors in FinFET and Planar SRAMs

Masanori Hashimoto (Kyoto University)

13/06/2024, 10:15

Abstract:

Transient malfunctions (soft errors) caused by secondary cosmic ray particles raining down on the Earth have become a major factor determining the reliability of information systems. Until now, the technology to evaluate soft errors mainly focused on neutrons contained in secondary cosmic rays, and techniques to counteract these errors have been developed and accumulated....

44. Discussion with the audience

13/06/2024, 10:35