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09:00
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Announcements
(until 09:10)
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09:00
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Announcements
- Dr
Gerd Luis Datzmann
Ennio Tito Capria
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09:10
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Session 4: Alternative Probes for SEE Testing
(until 10:50)
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09:10
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Session introduction
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Chair: Camille Bélanger-Champagne (TRIUMF)
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09:15
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Talk 1: Laser-driven beams for radiation-to-electronics study
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Roberto Versaci (ELI ERIC)
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09:35
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Talk 2: How synchrotron light sources can help overcome the major limitations related to Heavy Ions Single Event Effects testing in electronic circuits
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Ennio Capria (ESRF)
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09:55
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Talk 3: How pulsed laser SEE testing aids the space qualification of EEE components
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Richard Sharp (Radtest)
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10:15
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Talk 4: Muon-induced Soft Errors in FinFET and Planar SRAMs
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Masanori Hashimoto (Kyoto University)
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10:35
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Discussion with the audience
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10:50
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--- Coffee break ---
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11:20
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Session 5: Protons and Heavy Ions: The Facilities' View
(until 13:10)
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11:20
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Session Introduction
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Chair: Jochen Kuhnhenn (Fraunhofer)
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11:25
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Talk 1: Single Event Effects (SEE) Testing in the United States: The Current State of Facility Access and Considerations Moving Forward
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Kenneth LaBel (The Johns Hopkins University / Applied Physics Laboratory)
(The Johns Hopkins University / Applied Physics Laboratory)
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11:50
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Talk 2: Landscape of European Facilities Delivering Protons and Heavy Ions: Status and Perspectives
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Gerd Luis Datzmann (Datzmann Interact & Innovate)
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12:10
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Talk 3: The experience of HollandPTC in setting up a radiation hardness test facility
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Marta Rovituso (HollandPTC)
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12:30
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Talk 4: Prospects of proton and ion microbeams for radiation hardness testing
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Günther Dollinger (Universität der Bundeswehr)
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12:55
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Discussion with Audience
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