Abstract:
Heavy-ion microbeam testing offers unique capabilities for exploring the fundamental mechanisms of single-event effects (SEEs) in electronic devices. This method utilizes a beam focused to a diameter of less than 1 µm to irradiate specific regions on the surface of the device selected by an optical microscope directly installed in the vacuum chamber.
The dimensions of the scanned...
Abstract:
This talk tries to give answers to the following questions of less experienced people:
Why do I need to test with protons? What radiation effects are covered? When do I need a proton test and when are other particle types better (heavy ions, neutrons)? How do I need to prepare my device under test (DUT)? What is the relevant dosimetry? What flux and fluence do I need for which...
Abstract:
New Space companies vary in radiation testing approaches. New ventures prioritize rapid deployment and initial operation phases to secure further funding, while mature companies face customer demands for some level of radiation risk mitigation without the full cost of a "rad hard" approach. There is frustration over the high costs, resource demands, and lack of clear guidelines...
Abstract:
As the complexity of electronic devices increases (artificial intelligence, big-data processing applications, 3D integrated devices, etc.) and new space advances, the paradigms for single event testing are evolving. In particular, one of the areas of strong interest is the use of high-energy heavy ion beams. The aim of this contribution is to discuss the motivations, requirements,...
Abstract:
Space market evolution towards more flexible, agile and integrated systems, such as SmallSats or satellite constellations, is pushing the use of more complex EEE parts.
Newspace market particularly accelerated the introduction, in space units, of COTS devices, i.e. components not designed to endure space environment constraints, generating, in fact, a strong demand to evaluate...
