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Training on semiconductor devices, design and manufacturing

1–2 Jul 2013
Katane Palace Hotel, Catania (Italy)
Europe/Zurich timezone

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Contribution List

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  1. 15. Registration
    01/07/2013, 08:15
  2. 12. Welcome and Introduction to the Course
    Dr Massimo Mazzillo (STMicroelectronics)
    01/07/2013, 08:45
  3. 17. Brief Introduction of STMicroelectronics and Microelectronics Historical Notes
    Dr Giuseppe Arena (STMicroelectronics)
    01/07/2013, 09:00
  4. 0. Semiconductors Processing and Devices Fabrication - 1st part (crystal growth and epitaxy, thermal oxidation, ion implantation and diffusion)
    Dr Giuseppe Arena (STMicroelectronics)
    01/07/2013, 09:30
  5. 1. Semiconductors Processing and Devices Fabrication – 2nd part (Thin film deposition, photolithography, plasma basics, etching and new trends in microelectronics industry)
    Dr Giuseppe Arena (ST Microelectronics)
    01/07/2013, 11:00
  6. 16. Electrical Parametric Testing
    Dr Stefano Sannella (ST)
    01/07/2013, 14:00
  7. 4. Electronic Devices Packaging
    Dr Federico Ziglioli (STMicroelectronics)
    01/07/2013, 14:50
  8. 3. TCAD Process and Device Simulations
    Dr Cristina Miccoli (STMicroelectronics)
    01/07/2013, 15:40
  9. 5. STMicroelectronics Silicon Photomultiplier Technology
    Dr Giuseppina Valvo (ST Microelectronics)
    01/07/2013, 16:50
  10. 18. Time-of-Flight PET Detector Development with SiPMs
    Dr Sergei Dolinsky (GE Global Research Center)
    01/07/2013, 17:40
  11. 6. First Group Visit (19 Participants)
    02/07/2013, 08:15
  12. 7. Second Group Visit (19 Participants)
    02/07/2013, 10:45
  13. 8. X-Ray Photoelectron Spectroscopy (XPS) and Secondary Ion Mass Spectrometry (SIMS)
    Dr Lucio Renna (ST Microelectronics)
    02/07/2013, 14:30
  14. 9. Optical Microscopy, Fault Detection and Isolation Techniques
    Dr Domenico Mello (ST Microelectronics)
    02/07/2013, 15:30
  15. 10. Samples Preparation and Transmission Electron Microscopy (TEM)
    Dr Domenico Mello (ST Microelectronics)
    02/07/2013, 16:50
  16. 11. Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM)
    Dr Domenico Mello (ST)
    02/07/2013, 17:50
  17. 14. Conclusions and Debriefing
    02/07/2013, 18:50
  18. 2. Photolithography and Etching
    Dr Giuseppe Arena (ST Microelectronics)
  19. 13. The Participants Introduce Themselves