Training on semiconductor devices, design and manufacturing

Contribution List

15. Registration

01/07/2013, 08:15

12. Welcome and Introduction to the Course

Dr Massimo Mazzillo (STMicroelectronics)

01/07/2013, 08:45

17. Brief Introduction of STMicroelectronics and Microelectronics Historical Notes

Dr Giuseppe Arena (STMicroelectronics)

01/07/2013, 09:00

Semiconductor Manufacturing Processes

0. Semiconductors Processing and Devices Fabrication - 1st part (crystal growth and epitaxy, thermal oxidation, ion implantation and diffusion)

Dr Giuseppe Arena (STMicroelectronics)

01/07/2013, 09:30

Semiconductor Manufacturing Processes

1. Semiconductors Processing and Devices Fabrication – 2nd part (Thin film deposition, photolithography, plasma basics, etching and new trends in microelectronics industry)

Dr Giuseppe Arena (ST Microelectronics)

01/07/2013, 11:00

Semiconductor Manufacturing Processes

16. Electrical Parametric Testing

Dr Stefano Sannella (ST)

01/07/2013, 14:00

Electrical Testing, Assembly and TCAD Simulations.

4. Electronic Devices Packaging

Dr Federico Ziglioli (STMicroelectronics)

01/07/2013, 14:50

Electrical Testing, Assembly and TCAD Simulations.

3. TCAD Process and Device Simulations

Dr Cristina Miccoli (STMicroelectronics)

01/07/2013, 15:40

Electrical Testing, Assembly and TCAD Simulations.

5. STMicroelectronics Silicon Photomultiplier Technology

Dr Giuseppina Valvo (ST Microelectronics)

01/07/2013, 16:50

Technology Development and Applications

18. Time-of-Flight PET Detector Development with SiPMs

Dr Sergei Dolinsky (GE Global Research Center)

01/07/2013, 17:40

Technology Development and Applications

6. First Group Visit (19 Participants)

02/07/2013, 08:15

Visit to STMicroelectronics M5 8” Clean Room Facilities

7. Second Group Visit (19 Participants)

02/07/2013, 10:45

Visit to STMicroelectronics M5 8” Clean Room Facilities

8. X-Ray Photoelectron Spectroscopy (XPS) and Secondary Ion Mass Spectrometry (SIMS)

Dr Lucio Renna (ST Microelectronics)

02/07/2013, 14:30

Surface Analysis and Solids Characterization

9. Optical Microscopy, Fault Detection and Isolation Techniques

Dr Domenico Mello (ST Microelectronics)

02/07/2013, 15:30

Surface Analysis and Solids Characterization

10. Samples Preparation and Transmission Electron Microscopy (TEM)

Dr Domenico Mello (ST Microelectronics)

02/07/2013, 16:50

Surface Analysis and Solids Characterization

11. Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM)

Dr Domenico Mello (ST)

02/07/2013, 17:50

Surface Analysis and Solids Characterization

14. Conclusions and Debriefing

02/07/2013, 18:50

2. Photolithography and Etching

Dr Giuseppe Arena (ST Microelectronics)

13. The Participants Introduce Themselves