Training on semiconductor devices, design and manufacturing

Name: Training on semiconductor devices, design and manufacturing
Start: 2013-07-01T08:00:00+02:00
End: 2013-07-02T19:15:00+02:00
Location: Katane Palace Hotel, Catania (Italy)

1–2 Jul 2013

Katane Palace Hotel, Catania (Italy)

Europe/Zurich timezone

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rita.giuffredi@cern.ch

Electrical Parametric Testing

1 Jul 2013, 14:00

50m

Katane Palace Hotel, Catania (Italy)

Via Finocchiaro Aprile, 110 - Catania (Italy)

Electrical Testing, Assembly and TCAD Simulations.

Dr Stefano Sannella (ST)

Slides

Parametric_Test.pdf

Training on semiconductor devices, design and manufacturing

Support

Electrical Parametric Testing

Katane Palace Hotel, Catania (Italy)

Speaker

Presentation materials

Choose timezone

Training on semiconductor devices, design and manufacturing

Support

Speaker

Presentation materials