Training on semiconductor devices, design and manufacturing

Name: Training on semiconductor devices, design and manufacturing
Start: 2013-07-01T08:00:00+02:00
End: 2013-07-02T19:15:00+02:00
Location: Katane Palace Hotel, Catania (Italy)

1–2 Jul 2013

Katane Palace Hotel, Catania (Italy)

Europe/Zurich timezone

Overview
Timetable
Contribution List
Book of Abstracts
Registration
Participant List
Accommodation & Venue
Back to PicoSEC-MC Net webpage

Support

rita.giuffredi@cern.ch

Time-of-Flight PET Detector Development with SiPMs

1 Jul 2013, 17:40

50m

Katane Palace Hotel, Catania (Italy)

Via Finocchiaro Aprile, 110 - Catania (Italy)

Technology Development and Applications

Dr Sergei Dolinsky (GE Global Research Center)

Slides

Time-of-Flight_PET_Detector_development_with_SiPM.pdf

Time-of-Flight_PET_Detector_development_with_SiPM.pptx

Training on semiconductor devices, design and manufacturing

Support

Time-of-Flight PET Detector Development with SiPMs

Katane Palace Hotel, Catania (Italy)

Speaker

Presentation materials

Choose timezone

Training on semiconductor devices, design and manufacturing

Support

Speaker

Presentation materials